Services
- Atomic absorption spectroscopy
- Atomic emission spectroscopy
- Dehydration under vacuum
- Determination of specific BET surface
- Electrochemical activity
- EPR analysis
- Infrared spectroscopy
- Lyophilization
- Mechanochemical synthesis
- Powder X-ray diffractometry
- Solid phase synthesis
- Spectrophotometry
- Temperature programmed reduction
- Thermal analysis: DTA/TG
- Titrimetry
- Transmission electron microscopy
- UV-vis spectroscopy
- X-ray photoelectron spectroscopy
Apparatus:
Powder X-Ray diffractometer- XRD
Services:
Collection of Powder diffraction patterns and software processing, X-Ray phase analysis. Analysis of morphological parameters of the phases presented in the sample, Determination of the crystal structure of phases in polycrystalline materials
Prices without VAT:
- Collection of powder diffraction pattern – 40 lv.
- Phase identification (up to two phases) – 20 lv.
- Phase identification of every additional phase above two (per phase) – 10 lv.
- Quantitative phase analysis (Rietveld quantification) – 240 lv.
- Crystallite size and strain determination,determination of degree of
crystalinity – 100 lv. - Refinement of the unit cell parameters (per phase) – 200 lv
- Detemination of the mean thickness of polycrystalline film -100 lv.
- Indexing of powder diffraction pattern – 200 lv.
- Processing of powder diffraction patterns (background removal, Ka2 striping etc.) – Negotiable
- Crystal structure determination from powder diffraction data -Negotiable
Contact person
Prof. PhD Daniela Kovacheva
e-mail: didka@svr.igic.bas.bg
tel. +359 2 979 2587